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C Fundamentals Of Semiconductor C-V MeasurementsMetallization. After Devices Are Fully Fabri-cated On The Wafer, C-V Is Used To Character-ize Threshold Voltages And Other Parameters During Reliability And Basic Device Testing And To Model The Performance Of These Devices. The Physics Of Semiconductor Capacitance A MOSCAP Structure Is A Fundamental Device Formed During Semiconductor Fabri- 1th, 2024


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